Researchers Develop Electric-Field-Based Writing for Low-Power MRAM

In recent years, computing technology has been evolving rapidly, and one of the most significant advancements has been the development of new types of memory designed to address the limitations of traditional random access memory (RAM). One such innovation is Magnetoresistive RAM (MRAM), a promising alternative to conventional memory that offers several distinct advantages. MRAM stands out for its non-volatility, meaning that it retains data even when the power is turned off, its high speed, enhanced storage capacity, and its ability to withstand more read and write cycles than traditional RAM. These characteristics make MRAM a compelling solution for a wide variety of modern computing applications, from consumer electronics to large-scale data centers.

Despite its many advantages, MRAM technology faces several challenges, the most significant being energy consumption during the data-writing process. Conventional MRAM devices typically require an electric current to change the magnetization state of the device’s magnetic tunnel junctions (MTJs), which store data. This process involves applying a current to flip the magnetization vectors, and while this technique is effective, it also results in energy loss due to Joule heating. The need for high currents to write data consumes a substantial amount of energy, which limits the overall efficiency of MRAM devices, particularly in applications where power consumption is a critical concern.

Addressing this energy challenge has been a focal point for researchers working on MRAM technology. A recent study published in Advanced Science by researchers from Osaka University has made significant strides in tackling this problem. The team proposes a novel approach that reduces the energy required for data writing in MRAM devices by utilizing an electric-field-based writing scheme, as opposed to the conventional current-based approach. This innovation could revolutionize the way MRAM is used, offering a much lower energy consumption model and making MRAM an even more viable alternative to traditional DRAM (dynamic RAM) in the process.

To understand why this development is so significant, it is helpful to compare MRAM with traditional RAM technologies. Conventional DRAM relies on transistors and capacitors as its fundamental storage units. However, DRAM is volatile, meaning that the data stored in DRAM requires continuous power to remain intact. When power is lost, so is the stored data. On the other hand, MRAM operates based on the principles of magnetization rather than charge. Data in MRAM is stored in the form of magnetic states, with the orientation of magnetization determining the data value. Since magnetization is non-volatile, MRAM retains data even without power, offering a major advantage over DRAM.

Atomic image of the ferromagnetic Co2FeSi layer/atomic layer/piezoelectric layer interface. The structure on the left uses an Fe atomic layer, whereas the V layer, shown on the right, is clear, promoting the crystal orientation of the ferromagnetic Co2FeSi layer above. Credit: T. Usami

In existing MRAM devices, the data writing process involves switching the magnetization vectors of the MTJs, which is typically done by applying an electric current. This current is responsible for flipping the magnetization state of the junction, analogous to how a capacitor’s charge state is switched in DRAM. However, to flip the magnetization, a large electric current is needed, and this results in Joule heating, which inevitably leads to higher energy consumption.

The Osaka University researchers sought to solve this problem by using an electric field instead of a current to switch the magnetization in MRAM devices. This method, known as electric-field control, has the potential to drastically reduce the energy consumption during the writing process, making it more efficient. The key to this technology lies in the use of a multiferroic heterostructure, which combines magnetic and electric properties in a single material. This heterostructure can respond to an applied electric field by altering its magnetization, thus eliminating the need for high electric currents and the associated energy losses.

One of the critical factors in developing effective multiferroic heterostructures is the converse magnetoelectric (CME) coupling coefficient, which measures the strength of the magnetization response to an electric field. The higher the CME coefficient, the more effectively the material can switch its magnetization using only an electric field. The researchers had previously reported a multiferroic heterostructure with a CME coupling coefficient greater than 10^-5 s/m, indicating a strong magnetization response. However, they faced challenges in stabilizing the magnetic anisotropy of the structure, particularly in the ferromagnetic layer made of Co2FeSi. The instability in this layer hindered the reliable operation of the electric-field-based switching mechanism.

To overcome this issue, the researchers introduced an ultra-thin vanadium layer between the ferromagnetic layer and the piezoelectric layer. The vanadium layer acted as a buffer, providing a clear interface and improving the stability of the multiferroic heterostructure. This enhancement allowed for more reliable control of the magnetic anisotropy in the Co2FeSi layer, leading to a stronger and more consistent CME effect. The new technology also enabled the researchers to reliably achieve two different magnetic states at zero electric field by adjusting the sweeping operation of the electric field, thus ensuring that the MRAM device could maintain a non-volatile binary state even when no electric field was applied.

These breakthroughs demonstrate two critical requirements for the development of practical magnetoelectric MRAM (ME-MRAM) devices. First, the new technology provides a reliable method for achieving a non-volatile binary state at zero electric field. Second, it achieves a giant CME effect, enabling the efficient switching of magnetization with a significantly reduced energy consumption compared to current MRAM devices. The implications of this research are far-reaching, as it opens the door to the creation of MRAM devices that can write data with far lower energy requirements, making them more suitable for use in low-power applications.

The potential impact of this technology extends beyond just lower power consumption. With the ability to write data more efficiently, MRAM devices could become more scalable and cost-effective, with increased storage capacity and enhanced endurance. This would make them an attractive alternative to DRAM in a wide range of applications, from mobile devices and laptops to larger systems such as data centers and supercomputers.

Additionally, the non-volatile nature of MRAM, combined with its low power consumption, makes it an ideal candidate for emerging technologies that require persistent memory. These include the Internet of Things (IoT), where devices need to store data without constantly drawing power, as well as autonomous systems that need reliable, low-energy memory for real-time processing. The ability to develop MRAM devices with lower energy consumption would also have significant environmental benefits, as reducing energy use in data centers and computing devices can lead to substantial reductions in carbon footprints.

Reference: Takamasa Usami et al, Artificial Control of Giant Converse Magnetoelectric Effect in Spintronic Multiferroic Heterostructure, Advanced Science (2024). DOI: 10.1002/advs.202413566

Leave a Comment